Sainz Menchón, MireiaGonzalez de Arrieta Martinez, IñigoLopez , Gabriel Alejandro2024-11-272024-11-27production.46835https://dx.doi.org/10.26876/ikergazte.v.05.21https://gordailua.ueu.eus/handle/123456789/2729Material amorfoen arloan nanomaterial beirakaren inguruko ikerketak ardatz nagusietako bat osatzen du. Materialhorien propietate optikoak eta egitura molekularra aztertzeko, erabilgarria suertatzen da erreflektantzia infragorri-ko neurketak burutzea, izaera kualitatiboa izan ohi dutenak. Silizearen sare amorfoan rol garrantzitsua jokatzendute Q3 eta Q4 izeneko egitura molekular tetraedrikoek, sarearen konektibitatea zehazten dute-eta, materialarenpropietateetan eragiten duena.Hori dela eta, lan honetan erreflektantzia espektroskopian oinarritutako silizenanopartikulen Q3 eta Q4 egituren populazioa kalkulatzeko metodo kuantitatiboa aurkeztuko da.Emaitzakerresonantzia magnetiko nuklear esperimentuan lorturikoekin parekatuko dira horien baliozkotasuna egiaztatzeko.The investigation of glassy nanomaterials is one of the main axes of amorphous material research.For thecharacterization of the optical properties and molecular structure of these materials, infrared reflectancemeasurements are useful. These analyses, however, are qualitative in character. Tetrahedral molecular structuresknown as Q3 and Q4 play an important role in the silica amorphous network, as they determine the topology ofthe network, which influences the properties of the material. Therefore, the purpose of this study is to offer aquantitative technique based on reflectance experiments for estimating the population of Q4 and Q3 structures insilica nanoparticles. To ensure their validity, the results were compared to those acquired by nuclear magneticresonance spectroscopy.espektroskopia infragorriasol-gel silizeananobeirakerresonantzia magnetiko nuklearrainfrared spectroscopysol-gel silicananoglassesnuclear magnetic resonanceFisikaKimikaintroduction